One of the problems of nanometrology is to create simple and affordable standard of length in the nanometer range. At the moment there is no small-sized standard with a length of exactly 1 nm, with which it would be possible to carry out the calibration of the scanning probe microscope directly in the scanning process. Its creation greatly simplifies the calibration of the microscope, and the standard itself is a solid metrological basis for the development of promising nanotechnologies.


Разработка: студия Green Art