An innovative and award-winning imaging technique, scanning microwave microscopy (SMM) mode, is discussed in this article. Developed by Agilent Technologies, SMM mode combines the comprehensive electrical measurement capabilities of a microwave vector network analyzer (VNA) with the nanoscale spatial resolution of an atomic force microscope (AFM). This groundbreaking AFM mode of operation offers unprecedented utility for a diverse set of applications


Разработка: студия Green Art