Development of the Nanoindustry Infrastructure More than five years ago in his Message to the Federal Assembly of the Russian Federation the Russian President described nanotechnologies as a priority direction of science and technology development. JSC "NTO" consistently carries out developments along strategically important lines of development of semiconductor nanoindustry ensuring technical and technological independence of Russia. Using the accumulated technological expertise, as well as new possibilities the "NTO" puts emphasis on complex technological support of Customers’ projects.
Electron Beam Deposition: Technology and Equipment Electron beams are widely used for heating, welding, melting, dimensional processing, spraying, in fundamental and applied research, including nanotechnologies. The essense of the electron beam effect consists in the kinetic energy of the beam getting transformed into heat in the treatment zone. As energy power and concentration ranges in the beam are considerable, it is possible to obtain all kinds of thermal effect on the material with high speeds. Due to concentration of heat energy in a range of thermal effect necessary for spraying practically any material and carrying out the process in vacuum, its cleanness and automation of equipment are provided.
Nanometer Dynamic Measuring Standard A nanometer dynamic measuring standard is demonstrated in the form of a piezoceramic plate. The nanometer standard can be easily used for calibration of scanning probe microscopes. It is especially important at measurement and data analysis during biomedical studies – imaging of proteins, DNA-protein complexes, viral particles, cell fragments, and biomarkers.
Examination of Вacteria with the Help of Scanning Probe Microscope The article describes the methods of bacteria sample preparation for viewing with a scanning probe microscope in air and in liquid. Different scanning modes and methods of cell fixing on a substrate surface are considered.
Confocal Raman-AFM Study of Graphene This work presents the results of investigation of a single atomic layer of graphene with the help of a confocal Raman microscopy & AFM. Such a combination allows to find two-dimensional layers of angstremes thickness, exactly define the amount of graphene flakes forming layers, identify chemically different materials or the difference between the properties within one material and thus obtain the full topographic and chemical structure of graphene.
Realization of the Innovative Potential of a University. Centers for Prototyping and Contract Manufacturing of Micro- and Nanotechnique The article is dedicated to the methodology of development of an effective form of commercialization of universities` intellectual and technological potentials within the framework of creation on their base of small innovation enterprises oriented to prototyping and contract manufacturing of competitive science-intensive micro- and nanotechnique products.
The first All-Russian Game Gompetition "Detective in the lab" Since April 2,2012, for three weeks school students from all over Russia took part in the first all-Russian online game "Nanoquest "Detective in the lab". The competition was organized by JSC "Advanced Technologies Center" together with the school league RUSNANO and Lomonosov Moscow State University. The aim of the quest was to show high school students that science can be really exciting.
The Idea of Louis de Broglie: the Spatial Structure of Quantum Particles It is shown that the solution of quantum equations of motion in the representation of the probability density gives the spin values of traditional quantum particles with a nonzero rest mass. The peripheral structure of the probability density of quantum particles is determined by their spin
Metrology and Standardization for Nanotechnology and Nanoindustry The article presents information about the 5th School on metrology and standardization in nanoindustry that has taken place in Chernogolovka. The reports showed the status and development of nanotechnologies in various S&T branches requiring specific improvement of accuracy of measurements on a nanolevel. It also gives information about modern devices for measuring control while carrying out nanotechnological operations.
Patent Expert Examination of High Technologies The previous issues of the "Nanoindustry" journal considered a number of provisions concerning issues of what can be invention, how to draw up an application for it. These articles taught the readers how to invent using unusual and, as it seems, interesting examples. Now, it is expedient to follow the path of the application. It is proposed to investigate some non-standard situations emerging while the application is passed over for patent expert examination, as it is better to learn using complicated instances.