One of the problems faced by producers and users of scanning probe and electron microscopes, and other devices for measuring the geometry of objects at the nanoscale is the difficulty in calibration due to the lack of nanoscale standardized measures and gauges. The Russian company Nano-Atto Metria offered an original solution based on the use of piezoelectric crystals (see also the article “Standards for nano- and picometer ranges on the basis of displacement gauges”, Nanoindustry, No.5(59), 2015). The project manager Petr Luskinovich told about this development.


Разработка: студия Green Art