THE POWER OF A SCANNING FORCE MICROSCOPE
The atomic force microscope has still another name – the scanning force microscope. When imaging with it, feedback must be used to control the interaction force between the probe and the sample. Generally, it must be kept at a minimum value so as not to deform the sample and probe during measurements. In contrast, in nanolithography and nanoindentation a large force must be applied to produce a clear pattern on the surface. In this paper we consider the forces that are generated and how much energy is expended when a typical defect in the form of a six-pointed star on graphite occurs.
Tags: atomic force microscope defects force curve graphite scanning force microscope атомно-силовой микроскоп графит дефекты силовая кривая сканирующий силовой микроскоп
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