The main stages of development of systems for scanning probe microscopy and spectroscopy of nanometer spatial resolution of the Russian production are considered. A new designs of devices of the NT-MDT Spectrum Instruments and new developments in the field of microelectromechanical systems for SPM are presented. Development trends with consideration of the peculiarities of Russia in interrelation with the world market of scientific instrumentation are analysed.


Разработка: студия Green Art