rus
Special Issue/2019
Yu. M. Gerasimov, N. G. Grigoryev, A. V. Kobylyatskiy, Ya. Ya. Petrichkovich
Test chips for experiment-based radiation hardness calculation of nanometer systems-on-chip
Test chips for experiment-based radiation hardness calculation of nanometer systems-on-chip
The paper highlights a concept of the test chip (TC) design as well as basic requirements for structures and blocks on the TC. The typical TC composition has been proposed for studying the technology capabilities in terms of radiation hardness and characterization thereof. It has been shown that the results of TC examination make it possible to predict the radiation hardness of systems-on-chip or SRAM chips by calculation and experimental methods.
The paper highlights a concept of the test chip (TC) design as well as basic requirements for structures and blocks on the TC. The typical TC composition has been proposed for studying the technology capabilities in terms of radiation hardness and characterization thereof. It has been shown that the results of TC examination make it possible to predict the radiation hardness of systems-on-chip or SRAM chips by calculation and experimental methods.
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