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SCANNING TUNNELING MICROSCOPY: ACCURACY OF RENDERING THE HEIGHT OF THE OBSERVED RELIEF OF SAMPLES DOI: https://doi.org/10.22184/1993-8578.2026.19.2.96.101
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I.V.Yaminsky
3D VISUALIZATION IN ATOMIC FORCE AND SCANNING CAPILLARY MICROSCOPY DOI: https://doi.org/10.22184/1993-8578.2026.19.2.118.126
3D VISUALIZATION IN ATOMIC FORCE AND SCANNING CAPILLARY MICROSCOPY DOI: https://doi.org/10.22184/1993-8578.2026.19.2.118.126
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SYNTHESIS OF CATALYTIC STRUCTURES ON THE SURFACE OF ION-EXCHANGE MEMBRANES BY MAGNETRON SPUTTERING DOI: https://doi.org/10.22184/1993-8578.2026.19.2.128.133
Nanomaterials
Equipment for nanoindustry