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Issue #2/2026
D.I.Yaminsky, I.V.Yaminsky
SCANNING TUNNELING MICROSCOPY: ACCURACY OF RENDERING THE HEIGHT OF THE OBSERVED RELIEF OF SAMPLES
SCANNING TUNNELING MICROSCOPY: ACCURACY OF RENDERING THE HEIGHT OF THE OBSERVED RELIEF OF SAMPLES
DOI: https://doi.org/10.22184/1993-8578.2026.19.2.96.101
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Subscribe to the journal Nanoindustry to read the full article.
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