rus
DOI: https://doi.org/10.22184/1993-8578.2025.18.6.346.354
In modern metrology, the size of an atom is determined statistically as half the interatomic distance in a crystal lattice, rather than through direct measurement of an isolated atom. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are key tools for directly observing and measuring the geometry of individual atoms weakly bound to a substrate. The image obtained in STM is the spatial distribution of the electron density of the outer shell of the atom. Although STM is traditionally considered a more detailed method, AFM with modified probes can in some cases provide greater resolution and the ability to chemically identify atoms. In this article, we have collected data on the observation of atoms and their size measurements using scanning tunneling and atomic force microscopy.
Tags: atomic force microscopy atoms nanometer standard scanning tunneling microscopy атомно-силовая микроскопия атомы сканирующая туннельная микроскопия эталон нанометра
Subscribe to the journal Nanoindustry to read the full article.
In modern metrology, the size of an atom is determined statistically as half the interatomic distance in a crystal lattice, rather than through direct measurement of an isolated atom. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are key tools for directly observing and measuring the geometry of individual atoms weakly bound to a substrate. The image obtained in STM is the spatial distribution of the electron density of the outer shell of the atom. Although STM is traditionally considered a more detailed method, AFM with modified probes can in some cases provide greater resolution and the ability to chemically identify atoms. In this article, we have collected data on the observation of atoms and their size measurements using scanning tunneling and atomic force microscopy.
Tags: atomic force microscopy atoms nanometer standard scanning tunneling microscopy атомно-силовая микроскопия атомы сканирующая туннельная микроскопия эталон нанометра
Subscribe to the journal Nanoindustry to read the full article.
Readers feedback
