rus
Issue #2/2020
I.V.Yaminskiy, А.I.Аkhmetova, G.B.Meshkov
Scanning probe microscopy of transition metal dichalcogenides
Scanning probe microscopy of transition metal dichalcogenides
DOI: 10.22184/1993-8578.2020.13.2.132.134
Scanning probe microscopy is a tool for taking measurements of the promising materials. Simplicity of the method allows of obtaining an impressive scope of information pertaining to morphology and surface structure, conductivity, study of material properties at heating.
Scanning probe microscopy is a tool for taking measurements of the promising materials. Simplicity of the method allows of obtaining an impressive scope of information pertaining to morphology and surface structure, conductivity, study of material properties at heating.
Теги: capillary microscopy lithography local anodic oxidation nanometer resolution scanning probe microscopy thin films капиллярная микроскопия литография локальное анодное окисление нанометровое разрешение сканирующая зондовая микроскопия
Scanning probe microscopy of transition metal dichalcogenides
Transition metal dichalcogenide monolayers are the prospective structures to manufacture optical devices of new generation. However, the optical properties of these 2D materials may vary and change over time, which makes it difficult to control the optoelectronic properties. There are numbers of different factors that may change optical properties, including doping of charges, defects, deformation, oxidation, adsorbed molecules and intercalation of water. Determination of the existing changes is usually not a simple task requiring multiple measurements use of several experimental methods which makes it difficult to optimize a preparation of these materials.
A significant instrument base enables the Russian scientific group to conduct comprehensive research in the framework of an international project in conjunction with the Sharif University of Technology (Tehran).
The Iranian scientific team prepared and provided samples for research using a FemtoScan scanning probe microscope. In the contact mode of atomic force microscopy the properties of the topography of WS2 samples on silicon, TiS3 on gold, and Fe2O3 on the surface of FTO glass (glass coated with tin oxide doped with fluorine) were studied.
Structurally, WS2 can be either individual flakes or layers of flakes. WS2, due to its crystalline structure similar to graphite, is an effective solid lubricant for friction units at elevated temperatures and contact loads. The recorded height of the WS2 film on the silicon surface visible in an atomic force microscope is 24 nm.
Scanning probe microscopy measurements were not limited to WS2 monolayers but were also applied to other 2D materials with optical transitions. In particular, the conductivity of TiS3 was measured on gold. In so doing, conductive cantilevers were used. According to the data obtained, when correlating the images of height and conductivity, an increase in the conductive properties is noticeable when the layers of titanium trisulfide drop.
Probe microscopy allows of a precise control over quality of the deposition of samples on substrates, in particular, when Fe2O3 is applied to the surface of FTO glass. Thanks to the FemtoScan Online software [4, 5], it is possible to use various color palettes and represent not only 2D, but 3D images of the scanned area.
Our results obtained with the aid of the scanning probe and capillary microscopy demonstrate the promising properties of WS2 and TiS3 for optoelectronic and nanophotonic devices. ■
The study was carried out with the financial support of the Russian Foundation for Basic Research in the framework of the scientific project No. 17-52-560001.
Transition metal dichalcogenide monolayers are the prospective structures to manufacture optical devices of new generation. However, the optical properties of these 2D materials may vary and change over time, which makes it difficult to control the optoelectronic properties. There are numbers of different factors that may change optical properties, including doping of charges, defects, deformation, oxidation, adsorbed molecules and intercalation of water. Determination of the existing changes is usually not a simple task requiring multiple measurements use of several experimental methods which makes it difficult to optimize a preparation of these materials.
A significant instrument base enables the Russian scientific group to conduct comprehensive research in the framework of an international project in conjunction with the Sharif University of Technology (Tehran).
The Iranian scientific team prepared and provided samples for research using a FemtoScan scanning probe microscope. In the contact mode of atomic force microscopy the properties of the topography of WS2 samples on silicon, TiS3 on gold, and Fe2O3 on the surface of FTO glass (glass coated with tin oxide doped with fluorine) were studied.
Structurally, WS2 can be either individual flakes or layers of flakes. WS2, due to its crystalline structure similar to graphite, is an effective solid lubricant for friction units at elevated temperatures and contact loads. The recorded height of the WS2 film on the silicon surface visible in an atomic force microscope is 24 nm.
Scanning probe microscopy measurements were not limited to WS2 monolayers but were also applied to other 2D materials with optical transitions. In particular, the conductivity of TiS3 was measured on gold. In so doing, conductive cantilevers were used. According to the data obtained, when correlating the images of height and conductivity, an increase in the conductive properties is noticeable when the layers of titanium trisulfide drop.
Probe microscopy allows of a precise control over quality of the deposition of samples on substrates, in particular, when Fe2O3 is applied to the surface of FTO glass. Thanks to the FemtoScan Online software [4, 5], it is possible to use various color palettes and represent not only 2D, but 3D images of the scanned area.
Our results obtained with the aid of the scanning probe and capillary microscopy demonstrate the promising properties of WS2 and TiS3 for optoelectronic and nanophotonic devices. ■
The study was carried out with the financial support of the Russian Foundation for Basic Research in the framework of the scientific project No. 17-52-560001.
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