rus
Issue #3-4/2025
I.V.Laktionov, A.S.Useinov, S.A.Votyakov, V.N.Reshetov, G.H.Sultanova
NANOSCAN SPECTROINDENTER: A NEW APPROACH TO NANOMECHANICAL TESTING INTEGRATED IN RAMAN MICROSCOPES
NANOSCAN SPECTROINDENTER: A NEW APPROACH TO NANOMECHANICAL TESTING INTEGRATED IN RAMAN MICROSCOPES
DOI: https://doi.org/10.22184/1993-8578.2025.18.3-4.234.238
The design of the NanoScan SpectroIndenter measurement module for integrating a nanohardness tester with a commercially available Raman microscope is presented, using the Renishaw InVia model as an example. An innovative inverse load device layout allows simultaneous time-synchronized measurements of mechanical and optical (structural) characteristics. The design features of the module and its technological advantages for the examination of both transparent and opaque materials are presented.
Tags: deformation nanoindentation spectrometer transparent indenter деформация наноиндентирование прозрачный индентор спектрометр
Subscribe to the journal Nanoindustry to read the full article.
The design of the NanoScan SpectroIndenter measurement module for integrating a nanohardness tester with a commercially available Raman microscope is presented, using the Renishaw InVia model as an example. An innovative inverse load device layout allows simultaneous time-synchronized measurements of mechanical and optical (structural) characteristics. The design features of the module and its technological advantages for the examination of both transparent and opaque materials are presented.
Tags: deformation nanoindentation spectrometer transparent indenter деформация наноиндентирование прозрачный индентор спектрометр
Subscribe to the journal Nanoindustry to read the full article.
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