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Issue #1/2026
D.I.Yaminsky, A.I.Fedoseev, I.V.Yaminsky
METROLOGICAL ASPECTS OF SCANNING PROBE MICROSCOPY
METROLOGICAL ASPECTS OF SCANNING PROBE MICROSCOPY
DOI: https://doi.org/10.22184/1993-8578.2026.19.1.32.35
Observing atoms and molecules has become a routine operation in scanning tunneling microscopy since its invention in 1982. Atomic force microscopy allows high-resolution observation of the atomic lattice of crystalline samples. After minimizing the force impact, it was possible to obtain images of atoms and vacancies in atomic force microscopy. The appeal of SPM is its ability to produce images of the micro and nanoworld with record-breaking quality and detail under normal conditions. Hovewer, the question of the limits of SPM remains unanswered. On the one hand, the answer pertains to metrology, on the other, to the fundamental questions of modern physics.
Subscribe to the journal Nanoindustry to read the full article.
Observing atoms and molecules has become a routine operation in scanning tunneling microscopy since its invention in 1982. Atomic force microscopy allows high-resolution observation of the atomic lattice of crystalline samples. After minimizing the force impact, it was possible to obtain images of atoms and vacancies in atomic force microscopy. The appeal of SPM is its ability to produce images of the micro and nanoworld with record-breaking quality and detail under normal conditions. Hovewer, the question of the limits of SPM remains unanswered. On the one hand, the answer pertains to metrology, on the other, to the fundamental questions of modern physics.
Subscribe to the journal Nanoindustry to read the full article.
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